overlayer
英
美
网络 覆盖层; 顶层; 具有工程覆层; 覆层; 覆盖物
现在分词：overlayering
英英释义
noun
- protective covering consisting, for example, of a layer of boards applied to the studs and joists of a building to strengthen it and serve as a foundation for a weatherproof exterior
双语例句
- Simulation Research and Actual Measurements on Water Conservation Mining and Overlayer Strata Movement of Thick Base Rock Shallow Seam
近浅埋煤层保水开采覆岩运动模拟研究与实测 - And P2P networks that belong to research in the field of application layer overlayer networks, because of its good scalability, support for load balancing and node dynamic join and leave, and other benefits, is a good foundation platform for the realization of application-layer multicast.
而同属于应用层覆盖网络研究领域的P2P网络，由于其具有良好的可扩展性，支持负载平衡以及节点动态加入和离去等优点，正好为应用层组播的实现提供了良好的基础平台。 - A Study on Interfacial Bonding Performance between Old Cement Concrete Pavement and Bituminous Overlayer
旧水泥路面与沥青加铺层间粘结性能 - At temperatures below 110 ℃, the sticking coefficient for In atoms is close to zero due to saturation of valence bonds resulting from the arrangement of In atoms in the 4 × 1-In overlayer.
在110℃以下，几乎为零的铟原子的粘着系数是由于4×1-In结构的原子排列使表面呈现价键饱和状态所致； - Formation Conditions of Compound Key Strata in Mining Overlayer Strata and Its Discriminance
采场覆岩中复合关键层的形成条件与判别方法 - Oxide overlayer effect on the measurement of the parameters of interband critical point: A fractional-dimensional space approach
表面氧化层效应对测量临界点跃迁的影响：分数维空间方法 - Metal overlayer thickness effects on the properties of a metal-semiconductor interface
金属层厚对金属&半导体界面性质的影响 - It is found that after etching in the CP-4 solution the InSb surfaces are covered by a native oxide overlayer in which the amounts of Sb oxide are obviously more than In oxide.
实验中发现经过CP-4腐蚀以后在样品的表面生成了InSb的氧化层，氧化层中的组分是锑的氧化物明显多于铟的氧化物。 - Key strata is a rock seam which plays an important controlling roles in the movement of mining overlayer strata while the key strata is sometimes made up of two or more compound rock strata.
在采场覆岩运动中起主要控制作用的岩层为关键层，而有时关键层是由2层或2层以上岩层形成的复合岩层所组成，我们称其为复合关键层。 - The fractional_dimensional space approach and analysis of spectroscopic ellipsometry are used to study an oxide overlayer effect on the measurement of the parameters of interband critical point ( CP) of Si by a Si_SiO 2 model.
运用椭偏技术和分数维空间方法，对SiSiO2模型考察了表面氧化层的存在对从实验测得的光谱中确定Si临界点跃迁参数的影响。